The main activities of this service deal with:

Device Characterisation and parameter extraction (SPICE) Equipment maintenance and set up Production wafer parametric test Test structure design and characterisationNew measurement techniques development Application specific system design and development (demonstrators)

People responsible/contacts:
Joaquín Santander (joaquin.santander@cnm.es)
Miquel Zabala (miquel.zabala@cnm.es)

 

EQUIPMENT AVAILABLE

1.- High performance DC measurement system

• Semiconductor parameter analyser
• Switching matrix with controller
• Automatic wafer prober
• System control
• Workstation and related software

2.- Static and dynamic power device measurement system

• Source-measurement units (4)
• Curve tracers (high and low power)
• Digital oscilloscope
• SourceMeter system
• Semi-automatic wafer prober
• Electrostatic discharge generator
• High voltage power supply
• System control workstation and related software

3.- Impedance analysis system

• Fast capacimeterImpedance analyser
• Picoamperimeter
• Automatic wafer prober
• System control workstation and related Software

4.- Dynamic and functional digital characterisation system

• Logic analyser
• Pulse generator
• Digital oscilloscope
• Digital multimeter
• Automatic wafer prober
• System control workstation and related software

5.- Physical sensor characterisation system

• Climatic chamber
• Stoves (2)
• Voltage scanner (2)
• Digital multimeter (2)
• Digital thermometer
• Pressure controller/calibrator (2)
• System control workstation and related software

5.- Physical sensor characterisation system

• Climatic chamber
• Stoves (2)
• Voltage scanner (2)
• Digital multimeter (2)
• Digital thermometer
• Pressure controller/calibrator (2)
• System control workstation and related software

6.-Chemical sensor characterisation system

• Impedance analyser
• Glass electrodes
• Flow systems for calibration
• Conductivity meter(2)
• pH-meter (5) and ISFET-meter(3)
• Potentiostat/Galvanostat

7.- Infrared thermography system

8.- Other specialised equipment

• Semiconductor parameter analyser
• Network analyser
• Spectrum analyser
• Manual wafer prober BTS system

9.- General purpose DC and AC measurement system

• Power supplies, digital multimeters, current and voltage sources, digital counter, digital oscilloscopes, arbitrary/function generators, ...